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Optica Publishing Group
  • Journal of the Optical Society of Korea
  • Vol. 10,
  • Issue 4,
  • pp. 188-195
  • (2006)

Third-Harmonic Generation Microscopy for Material Characterization

Open Access Open Access


Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then applied to characterize different types of materials in terms of electronic third-order susceptibility. Examples of bulk glasses, poled glasses, laser-induced modifications in glasses and nanoparticles in solution are given in order to give a survey of the broad application field of THG microscopy in material characterization.

© 2006 Optical Society of Korea

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