Abstract
A brief description of the software designed to take into account the absorption of infrared radiation during the bench testing and certification of optoelectronic equipment is presented. Estimates of the error of calculation of the individual components of the computational algorithm are presented. To estimate the impact of software on the metrological characteristics of measuring instruments, a comparison method based on the use of software of comparable level is used. The executive characteristic values of the algorithm are calculated. The results were used for the certification of software within the system of voluntary certification of software of measuring instruments.
© 2019 Optical Society of America
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription