Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Taking absorbed infrared radiation into account during the testing and certification of optoelectronic equipment

Not Accessible

Your library or personal account may give you access

Abstract

A brief description of the software designed to take into account the absorption of infrared radiation during the bench testing and certification of optoelectronic equipment is presented. Estimates of the error of calculation of the individual components of the computational algorithm are presented. To estimate the impact of software on the metrological characteristics of measuring instruments, a comparison method based on the use of software of comparable level is used. The executive characteristic values of the algorithm are calculated. The results were used for the certification of software within the system of voluntary certification of software of measuring instruments.

© 2019 Optical Society of America

PDF Article
More Like This
Lidar observations during dusty infrared Test-1

Jagir S. Randhawa and Jan E. Van der Laan
Appl. Opt. 19(14) 2291-2297 (1980)

Theoretical study of multilayer coatingreflection taking into account third-order optical nonlinearities

Olaf Stenzel and Steffen Wilbrandt
Appl. Opt. 57(29) 8640-8647 (2018)

Infrared Atmospheric Transmission of Laser Radiation

J. Y. Wang
Appl. Opt. 13(1) 56-62 (1974)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.