1 August 2009, Volume 76, Issue 8, pp. 453-525  
16 articles

Foreword to this issue

J. Opt. Technol. 76(8), 453-454 (2009)  View: PDF

Modern trends in optical technologies used to improve the output characteristics of optical and optoelectronic systems

J. Opt. Technol. 76(8), 455-461 (2009)  View: PDF

New developments of scientific and medical apparatus at S. A. Zverev Krasnogorsk Factory

J. Opt. Technol. 76(8), 462-464 (2009)  View: PDF

Development of laser rangefinder-binoculars at S. A. Zverev Krasnogorsk Factory

J. Opt. Technol. 76(8), 465-467 (2009)  View: PDF

New approach to the development of optoelectronic facilities for monitoring near-earth space

J. Opt. Technol. 76(8), 468-472 (2009)  View: PDF

Acoustooptical method of spectral–polarization image analysis

J. Opt. Technol. 76(8), 473-477 (2009)  View: PDF

Microchannel device for remote diagnosis of technical equipment

J. Opt. Technol. 76(8), 486-490 (2009)  View: PDF

Zoom sights with automatic setting of sighting angles for modern sniper complexes

J. Opt. Technol. 76(8), 491-495 (2009)  View: PDF

Prospects for the development of optical systems for nanolithography

J. Opt. Technol. 76(8), 496-503 (2009)  View: PDF

Protection from direct illumination in the system of the astrograph for the Interplanetary Solar Stereoscopic Observatory

J. Opt. Technol. 76(8), 504-506 (2009)  View: PDF

Optoelectronic system for monitoring displacements, based on LED fiducial marks

J. Opt. Technol. 76(8), 507-510 (2009)  View: PDF

Experimental study of how the photosensitive elements of optoelectronic devices react to pulsed illumination

J. Opt. Technol. 76(8), 511-515 (2009)  View: PDF

Differential refractometers for analyzing transparent media

J. Opt. Technol. 76(8), 516-519 (2009)  View: PDF

Comparing thermal and electrical methods for controlling the wavelength of semiconductor-laser radiation

J. Opt. Technol. 76(8), 520-525 (2009)  View: PDF