Abstract

Optical coherence tomography (OCT) is a promising tool for detecting micro channels, metal prints, defects and delaminations embedded in alumina and zirconia ceramic layers at hundreds of micrometers beneath surfaces. The effect of surface roughness and scattering of probing radiation within sample on OCT inspection is analyzed from the experimental and simulated OCT images of the ceramic samples with varying surface roughnesses and operating wavelengths. By Monte Carlo simulations of the OCT images in the mid-IR the optimal operating wavelength is found to be 4 µm for the alumina samples and 2 µm for the zirconia samples for achieving sufficient probing depth of about 1 mm. The effects of rough surfaces and dispersion on the detection of the embedded boundaries are discussed. Two types of image artefacts are found in OCT images due to multiple reflections between neighboring boundaries and inhomogeneity of refractive index.

© 2014 Optical Society of America

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2013 (1)

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

2012 (3)

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

R. Su, M. Kirillin, P. Ekberg, A. Roos, E. Sergeeva, and L. Mattsson, “Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic,” Opt. Express 20(4), 4603–4618 (2012).
[Crossref] [PubMed]

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

2010 (1)

K. A. Serrels, M. K. Renner, and D. T. Reid, “Optical coherence tomography for non-destructive investigation of silicon integrated-circuits,” Microelectron. Eng. 87(9), 1785–1791 (2010).
[Crossref]

2008 (2)

U. Sharma, E. W. Chang, and S. H. Yun, “Long-wavelength optical coherence tomography at 1.7 microm for enhanced imaging depth,” Opt. Express 16(24), 19712–19723 (2008).
[Crossref] [PubMed]

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

2007 (2)

D. Stifter, “Beyond biomedicine: a review of alternative applications and developments for optical coherence tomography,” Appl. Phys. B 88(3), 337–357 (2007).
[Crossref]

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

2006 (1)

W. A. Ellingson, R. J. Visher, and R. S. Lipanovich, “Optical NDE techniques for ceramic thermal barrier coatings,” Mater. Eval. 1, 1–17 (2006).

2002 (2)

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

J. Caron, J. Lafait, and C. Andraud, “Scalar Kirchhoff's model for light scattering from dielectric random rough surfaces,” Opt. Commun. 207(1-6), 17–28 (2002).
[Crossref]

1998 (1)

1990 (1)

1974 (1)

J. G. J. Peelen and R. Metselaar, “Light scattering by pores in polycrystalline materials: Transmission properties of alumina,” J. Appl. Phys. 45(1), 216–220 (1974).
[Crossref]

1962 (1)

Agger, C.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Alarousu, E.

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

Andraud, C.

J. Caron, J. Lafait, and C. Andraud, “Scalar Kirchhoff's model for light scattering from dielectric random rough surfaces,” Opt. Commun. 207(1-6), 17–28 (2002).
[Crossref]

Balabuc, C.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Bang, O.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Bashkansky, M.

Bowen, P.

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Bradu, A.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Cantoni, M.

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Caron, J.

J. Caron, J. Lafait, and C. Andraud, “Scalar Kirchhoff's model for light scattering from dielectric random rough surfaces,” Opt. Commun. 207(1-6), 17–28 (2002).
[Crossref]

Chang, E. W.

Cheung, C. S.

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

Clarkson, W. A.

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

Daniel, J. M. O.

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

Duncan, M. D.

Dupont, S.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Ekberg, P.

Ellingson, W. A.

W. A. Ellingson, R. J. Visher, and R. S. Lipanovich, “Optical NDE techniques for ceramic thermal barrier coatings,” Mater. Eval. 1, 1–17 (2006).

Fabritius, T.

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

Fercher, A. F.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Filip, L.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Hitzenberger, C. K.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Hughes, M.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Karamata, B.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Keiding, S. R.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Kirillin, M.

R. Su, M. Kirillin, P. Ekberg, A. Roos, E. Sergeeva, and L. Mattsson, “Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic,” Opt. Express 20(4), 4603–4618 (2012).
[Crossref] [PubMed]

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

Kometani, T. Y.

Lafait, J.

J. Caron, J. Lafait, and C. Andraud, “Scalar Kirchhoff's model for light scattering from dielectric random rough surfaces,” Opt. Commun. 207(1-6), 17–28 (2002).
[Crossref]

Lasser, T.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Liang, H.

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

Lipanovich, R. S.

W. A. Ellingson, R. J. Visher, and R. S. Lipanovich, “Optical NDE techniques for ceramic thermal barrier coatings,” Mater. Eval. 1, 1–17 (2006).

Malitson, I. H.

Mattsson, L.

Metselaar, R.

J. G. J. Peelen and R. Metselaar, “Light scattering by pores in polycrystalline materials: Transmission properties of alumina,” J. Appl. Phys. 45(1), 216–220 (1974).
[Crossref]

Moselund, P. M.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Myllylä, R.

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

Nassau, K.

Negrutiu, M. L.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Pecharroman, C.

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Peelen, J. G. J.

J. G. J. Peelen and R. Metselaar, “Light scattering by pores in polycrystalline materials: Transmission properties of alumina,” J. Appl. Phys. 45(1), 216–220 (1974).
[Crossref]

Petersen, C.

P. M. Moselund, C. Petersen, S. Dupont, C. Agger, O. Bang, and S. R. Keiding, “Supercontinuum: broad as a lamp, bright as a laser, now in the mid-infrared,” Proc. SPIE 8381, 83811A (2012).
[Crossref]

Podoleanu, A. G.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Priezzhev, A. V.

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

Reid, D. T.

K. A. Serrels, M. K. Renner, and D. T. Reid, “Optical coherence tomography for non-destructive investigation of silicon integrated-circuits,” Microelectron. Eng. 87(9), 1785–1791 (2010).
[Crossref]

Reintjes, J.

Renner, M. K.

K. A. Serrels, M. K. Renner, and D. T. Reid, “Optical coherence tomography for non-destructive investigation of silicon integrated-circuits,” Microelectron. Eng. 87(9), 1785–1791 (2010).
[Crossref]

Rominu, R.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Roos, A.

Sergeeva, E.

Serrels, K. A.

K. A. Serrels, M. K. Renner, and D. T. Reid, “Optical coherence tomography for non-destructive investigation of silicon integrated-circuits,” Microelectron. Eng. 87(9), 1785–1791 (2010).
[Crossref]

Sharma, U.

Sinescu, C.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Sticker, M.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Stifter, D.

D. Stifter, “Beyond biomedicine: a review of alternative applications and developments for optical coherence tomography,” Appl. Phys. B 88(3), 337–357 (2007).
[Crossref]

Stuer, M.

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Su, R.

Todea, C.

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

Tokurakawa, M.

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

Visher, R. J.

W. A. Ellingson, R. J. Visher, and R. S. Lipanovich, “Optical NDE techniques for ceramic thermal barrier coatings,” Mater. Eval. 1, 1–17 (2006).

Wood, D. L.

Yun, S. H.

Zawadzki, R.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

Zhao, Z.

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Adv. Funct. Mater. (1)

M. Stuer, P. Bowen, M. Cantoni, C. Pecharroman, and Z. Zhao, “Nanopore Characterization and Optical Modeling of Transparent Polycrystalline Alumina,” Adv. Funct. Mater. 22(11), 2303–2309 (2012).
[Crossref]

Appl. Opt. (1)

Appl. Phys. B (1)

D. Stifter, “Beyond biomedicine: a review of alternative applications and developments for optical coherence tomography,” Appl. Phys. B 88(3), 337–357 (2007).
[Crossref]

J. Appl. Phys. (1)

J. G. J. Peelen and R. Metselaar, “Light scattering by pores in polycrystalline materials: Transmission properties of alumina,” J. Appl. Phys. 45(1), 216–220 (1974).
[Crossref]

J. Biomed. Opt. (1)

C. Sinescu, M. L. Negrutiu, C. Todea, C. Balabuc, L. Filip, R. Rominu, A. Bradu, M. Hughes, and A. G. Podoleanu, “Quality assessment of dental treatments using en-face optical coherence tomography,” J. Biomed. Opt. 13(5), 054065 (2008).
[Crossref] [PubMed]

J. Eur. Opt. Soc.- Rapid Publ. (1)

M. Kirillin, E. Alarousu, T. Fabritius, R. Myllylä, and A. V. Priezzhev, “Visualization of paper structure by optical coherence tomography: Monte Carlo simulations and experimental study,” J. Eur. Opt. Soc.- Rapid Publ. 2, 07031 (2007).
[Crossref]

J. Opt. Soc. Am. (1)

Mater. Eval. (1)

W. A. Ellingson, R. J. Visher, and R. S. Lipanovich, “Optical NDE techniques for ceramic thermal barrier coatings,” Mater. Eval. 1, 1–17 (2006).

Microelectron. Eng. (1)

K. A. Serrels, M. K. Renner, and D. T. Reid, “Optical coherence tomography for non-destructive investigation of silicon integrated-circuits,” Microelectron. Eng. 87(9), 1785–1791 (2010).
[Crossref]

Opt. Commun. (2)

A. F. Fercher, C. K. Hitzenberger, M. Sticker, R. Zawadzki, B. Karamata, and T. Lasser, “Dispersion compensation for optical coherence tomography depth-scan signals by a numerical technique,” Opt. Commun. 204(1-6), 67–74 (2002).
[Crossref]

J. Caron, J. Lafait, and C. Andraud, “Scalar Kirchhoff's model for light scattering from dielectric random rough surfaces,” Opt. Commun. 207(1-6), 17–28 (2002).
[Crossref]

Opt. Express (3)

Proc. SPIE (2)

C. S. Cheung, M. Tokurakawa, J. M. O. Daniel, W. A. Clarkson, and H. Liang, “Long wavelength optical coherence tomography for painted objects,” Proc. SPIE 8790, 87900J (2013).
[Crossref]

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Figures (14)
Fig. 1
Fig. 1 SEM image of the zirconia sample with pores in the surface (black). The alumina samples have very similar microstructure. Image courtesy of Lars Eklund, Swerea IVF.

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Fig. 2
Fig. 2 Spectra of the scattering coefficients of the alumina and zirconia ceramic samples. The lines represent the results calculated from the measured in-line transmittance, and the circles present the results obtained from Mie calculation.

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Fig. 3
Fig. 3 Derived anisotropy factors from Mie calculations of the alumina and zirconia ceramic samples.

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Fig. 4
Fig. 4 Geometric model of the ceramic sample stack. The imaging cross section is marked as the red frame. The callouts indicate the corresponding dimensions. The thickness of the top layer is 375 µm for the zirconia sample in the experiment.

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Fig. 5
Fig. 5 Cross-sectional B-scan OCT images of the alumina sample stack. A) λ = 1.3 µm, polished top layer; B) λ = 1.7 µm, polished top layer; C) λ = 1.3 µm, un-polished top layer; D) λ = 1.7 µm, un-polished top layer. The vertical and horizontal bars are 150 µm, where the former represents optical distance. The background noise is slightly higher for the 1.7 µm OCT system. The Wellman laboratory OCT systems are used.

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Fig. 6
Fig. 6 Cross-sectional OCT image of the ceramic stack with the 375 µm-thick zirconia top layer as measured by the Thorlabs OCT system working at 1.3 µm. The horizontal bar is 200 µm and the vertical bar corresponding to optical distance of 150 µm.

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Fig. 7
Fig. 7 Schematic cross-sectional geometric models input to the Monte Carlo simulation program for simulating OCT images. The axes correspond to physical lengths. The models are applied to both alumina and zirconia samples for direct comparison of the simulation results. S1-S4 represents the four surfaces and σ the different rms roughness values.

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Fig. 8
Fig. 8 Quantitative comparison of the experimental and simulated OCT A-scans from alumina samples (model I and II). The averaged A-scans (over 50 A-lines) extracted from A) Fig. 5(b) and B) Fig. 5(d) are shown as red dots, and the simulated averaged A-scan for λ = 1.7 µm, alumina is shown as the black line. The simulated A-scans are truncated at a dynamic range of 50dB in this figure.

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Fig. 9
Fig. 9 Quantitative comparison of the experimental and simulated OCT A-scans from zirconia sample. The averaged A-scan, extracted from Fig. 6, is shown as red circle and the simulated averaged A-scan is shown as black line.

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Fig. 10
Fig. 10 Simulated OCT images of alumina obtained by model I (30 nm rms surface roughness of the upper 450 µm-thick layer) for the five indicated wavelengths, where dispersion is accounted for λ = 3 µm and 4 µm. The vertical axis represents the optical distance as shown to the far left and the color-coded calculated intensity is given to the far right. The inverted channel signature at the bottom boundary is caused by shorter optical path through the air (black) in the channel.

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Fig. 11
Fig. 11 Simulated OCT images of alumina obtained by model II (90 nm rms roughness of the surfaces of the upper layer appearing at optical distances OZ = 0 and around 780 µm) for the five indicated wavelengths, where dispersion is accounted for λ = 3 µm and 4 µm. The vertical axis represents the optical distance as shown to the far left and the color-coded calculated intensity is given to the far right. The inverted channel signature at the bottom boundary is caused by shorter optical path through the air (black) in the channel.

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Fig. 12
Fig. 12 Comparison of the simulated OCT images of alumina obtained by both model I and II for λ = 4 µm, with and without account of dispersion. The vertical axis represents the optical distance as shown to the far left and the color-coded calculated intensity is given to the far right.

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Fig. 13
Fig. 13 Simulated OCT images of the smoother surface model I for zirconia at four different wavelengths. Dispersion is accounted for λ = 3 µm. The vertical axis represents the optical distance as shown to the far left and the color-coded calculated intensity is given to the far right.

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Fig. 14
Fig. 14 The same simulation as in Fig. 13 but now using model II, with a roughness of 90 nm rms of the surfaces of the upper layer appearing at optical distances OZ = 0 and around 1000 µm. Dispersion is accounted for λ = 3 µm.

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Tables (4)

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Table 1 Specifications of the Swept-source OCT Systems

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Table 2 Pore Size Distributions and Porosity of the Alumina and Zirconia Samples

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Table 3 Optical Properties Input to the Monte Carlo Simulation Program

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Table 4 OCT Parameters Input to the Monte Carlo Simulation Program

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Equations (5)

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T C = T F 2 exp(− μ s d)
T C = T F 2 exp( −4 π 2 σ 2 λ 2 (n−1) 2 (1+ n 2 ) )exp( − μ s d )
n= ( 1+ 1.023798× λ 2 λ 2 −0.00377588 + 1.058264× λ 2 λ 2 −0.0122544 + 5.280792× λ 2 λ 2 −321.3616 ) 1/2
n= ( 1+ 2.4255525× λ 2 λ 2 −0.0291903 + 1.431390× λ 2 λ 2 −0.0031494 + 12.27123× λ 2 λ 2 −686.8924 ) 1/2
I disp =0.5⋅ I λ +0.25⋅ I λ− Δλ /2 +0.25⋅ I λ+ Δλ /2

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