Abstract

We apply the concept of spoof surface plasmon polaritons (SPPs) to the design of differential microstrip lines by introducing periodic subwavelength corrugations on their edges. The dispersion relation and field distribution of those lines are analyzed numerically. And then through designing practical coupling circuits, we found that compared with conventional differential microstrip lines, the electromagnetic field can be strongly confined inside the grooves of the corrugated microstrip lines, so the crosstalk between the differential pair and the adjacent microstrip lines is greatly reduced, and the conversion from the differential signal to the common mode signal can also be effectively suppressed. The propagation length of those lines is also very long in a wide band. Moreover, the experimental results in time domain demonstrate those lines perform very well in high-speed circuit. Therefore, those novel kinds of spoof SPPs based differential microstrip lines can be widely utilized in high-density microwave circuits and guarantee signal integrity in high-speed systems.

© 2014 Optical Society of America

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References

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  1. F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
    [Crossref]
  2. S. Seki and H. Hasegawa, “Analysis of crosstalk in very high-speed LSI/VLSIs using a coupled multiconductor MIS microstrip line model,” IEEE Trans. Microwave Theory and Technique 32(12), 1715–1720 (1984).
    [Crossref]
  3. D. N. Ladd and G. I. Costache, “SPICE simulation used to characterize the cross-talk reduction effect of additional tracks grounded with vias on printed circuit boards,” IEEE Trans. Circuits and Systems II: Analog and Digital Signal 39(6),342–347 (1992).
    [Crossref]
  4. A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
    [Crossref]
  5. S. Dai, A. Z. Elsherbeni, and C. E. Smith, “Nonuniform FDTD formulation for the analysis and reduction of crosstalk on coupled microstrip lines,” J. Electromagnetic Waves Applications 10, 1663–1682 (1996).
    [Crossref]
  6. W. T. Huang, C. H. Lu, and D. B. Lin, “Suppression of crosstalk using serpentine guard trace vias,” Progress In Electromagnetics Research 109, 37–61 (2010).
    [Crossref]
  7. K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
    [Crossref]
  8. S. H. Hall and L. H. Howard, Advanced Signal Integrity for High-Speed Digital Designs (Wiley-IEEE, 2009).
    [Crossref]
  9. S. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007).
  10. L. Liu, Z. Han, and S. He, “Novel surface plasmon waveguide for high integration,” Opt. Express 13(17), 6645–6650 (2005).
    [Crossref] [PubMed]
  11. J. B. Pendry, L. Martin-Moreno, and F. J. Garcia-Vidal, “Mimicking surface plasmons with structured surfaces,” Science 305, 847–848 (2004).
    [Crossref] [PubMed]
  12. F. J. Garca De Abajo and J. J. Saenz, “Electromagnetic surface modes in structured perfect-conductor surfaces,” Phys. Rev. Lett. 95, 233901 (2005).
    [Crossref]
  13. F. J. Garca De Abajo, “Light scattering by particle and hole arrays,” Rev. Modern Phys 79, 1267–1290 (2007)
    [Crossref]
  14. A. P. Hibbins, B. R. Evans, and J. R. Sambles, “Experimental verification of designer Surface plasmons,” Science 308, 670–672 (2005).
    [Crossref] [PubMed]
  15. S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
    [Crossref] [PubMed]
  16. D. Martin-Cano, M. L. Nesterov, A. I. Fernandez-Dominguez, F. J. Garcia-Vidal, L. Martin-Moreno, and Esteban Moreno, “Domino plasmons for subwavelength terahertz circuitry,” Opt. Express 18(2), 754–764 (2010).
    [Crossref] [PubMed]
  17. J. J. Wu, “Subwavelength microwave guiding by periodically corrugated strip line,” Progress In Electromagnetics Research 104, 113–123 (2010).
    [Crossref]
  18. J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
    [Crossref]
  19. S. K. Koo, H. S. Lee, and Y. B. Park, “Crosstalk reduction effect of asymmetry stub loaded lines,” Journal of Electromagnetic Waves and Applications 25, 1156–1167 (2011).
    [Crossref]
  20. X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).
  21. X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
    [Crossref]
  22. H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
    [Crossref]
  23. J. A. Kong, Electromagnetic Wave Theory (Cambridge, 2005).

2014 (1)

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

2013 (2)

X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
[Crossref]

2011 (1)

S. K. Koo, H. S. Lee, and Y. B. Park, “Crosstalk reduction effect of asymmetry stub loaded lines,” Journal of Electromagnetic Waves and Applications 25, 1156–1167 (2011).
[Crossref]

2010 (5)

D. Martin-Cano, M. L. Nesterov, A. I. Fernandez-Dominguez, F. J. Garcia-Vidal, L. Martin-Moreno, and Esteban Moreno, “Domino plasmons for subwavelength terahertz circuitry,” Opt. Express 18(2), 754–764 (2010).
[Crossref] [PubMed]

J. J. Wu, “Subwavelength microwave guiding by periodically corrugated strip line,” Progress In Electromagnetics Research 104, 113–123 (2010).
[Crossref]

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

W. T. Huang, C. H. Lu, and D. B. Lin, “Suppression of crosstalk using serpentine guard trace vias,” Progress In Electromagnetics Research 109, 37–61 (2010).
[Crossref]

2008 (1)

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

2007 (1)

F. J. Garca De Abajo, “Light scattering by particle and hole arrays,” Rev. Modern Phys 79, 1267–1290 (2007)
[Crossref]

2006 (1)

S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
[Crossref] [PubMed]

2005 (3)

A. P. Hibbins, B. R. Evans, and J. R. Sambles, “Experimental verification of designer Surface plasmons,” Science 308, 670–672 (2005).
[Crossref] [PubMed]

F. J. Garca De Abajo and J. J. Saenz, “Electromagnetic surface modes in structured perfect-conductor surfaces,” Phys. Rev. Lett. 95, 233901 (2005).
[Crossref]

L. Liu, Z. Han, and S. He, “Novel surface plasmon waveguide for high integration,” Opt. Express 13(17), 6645–6650 (2005).
[Crossref] [PubMed]

2004 (1)

J. B. Pendry, L. Martin-Moreno, and F. J. Garcia-Vidal, “Mimicking surface plasmons with structured surfaces,” Science 305, 847–848 (2004).
[Crossref] [PubMed]

2001 (1)

F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
[Crossref]

1996 (1)

S. Dai, A. Z. Elsherbeni, and C. E. Smith, “Nonuniform FDTD formulation for the analysis and reduction of crosstalk on coupled microstrip lines,” J. Electromagnetic Waves Applications 10, 1663–1682 (1996).
[Crossref]

1992 (1)

D. N. Ladd and G. I. Costache, “SPICE simulation used to characterize the cross-talk reduction effect of additional tracks grounded with vias on printed circuit boards,” IEEE Trans. Circuits and Systems II: Analog and Digital Signal 39(6),342–347 (1992).
[Crossref]

1984 (1)

S. Seki and H. Hasegawa, “Analysis of crosstalk in very high-speed LSI/VLSIs using a coupled multiconductor MIS microstrip line model,” IEEE Trans. Microwave Theory and Technique 32(12), 1715–1720 (1984).
[Crossref]

Akhlaghi, S.

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

Andrews, S. R.

S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
[Crossref] [PubMed]

Bayderkhani, R.

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

Chang, H. J.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Cheng, Q.

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

Costache, G. I.

D. N. Ladd and G. I. Costache, “SPICE simulation used to characterize the cross-talk reduction effect of additional tracks grounded with vias on printed circuit boards,” IEEE Trans. Circuits and Systems II: Analog and Digital Signal 39(6),342–347 (1992).
[Crossref]

Cui, T. J.

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
[Crossref]

Dai, S.

S. Dai, A. Z. Elsherbeni, and C. E. Smith, “Nonuniform FDTD formulation for the analysis and reduction of crosstalk on coupled microstrip lines,” J. Electromagnetic Waves Applications 10, 1663–1682 (1996).
[Crossref]

Elsherbeni, A. Z.

S. Dai, A. Z. Elsherbeni, and C. E. Smith, “Nonuniform FDTD formulation for the analysis and reduction of crosstalk on coupled microstrip lines,” J. Electromagnetic Waves Applications 10, 1663–1682 (1996).
[Crossref]

Evans, B. R.

A. P. Hibbins, B. R. Evans, and J. R. Sambles, “Experimental verification of designer Surface plasmons,” Science 308, 670–672 (2005).
[Crossref] [PubMed]

Feng, Y. F.

X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

Fernandez-Dominguez, A. I.

Garca De Abajo, F. J.

F. J. Garca De Abajo, “Light scattering by particle and hole arrays,” Rev. Modern Phys 79, 1267–1290 (2007)
[Crossref]

F. J. Garca De Abajo and J. J. Saenz, “Electromagnetic surface modes in structured perfect-conductor surfaces,” Phys. Rev. Lett. 95, 233901 (2005).
[Crossref]

Garcia-Vidal, F. J.

X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
[Crossref]

D. Martin-Cano, M. L. Nesterov, A. I. Fernandez-Dominguez, F. J. Garcia-Vidal, L. Martin-Moreno, and Esteban Moreno, “Domino plasmons for subwavelength terahertz circuitry,” Opt. Express 18(2), 754–764 (2010).
[Crossref] [PubMed]

S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
[Crossref] [PubMed]

J. B. Pendry, L. Martin-Moreno, and F. J. Garcia-Vidal, “Mimicking surface plasmons with structured surfaces,” Science 305, 847–848 (2004).
[Crossref] [PubMed]

Ghasemi, A.

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

Hall, S. H.

S. H. Hall and L. H. Howard, Advanced Signal Integrity for High-Speed Digital Designs (Wiley-IEEE, 2009).
[Crossref]

Han, Z.

Hasegawa, H.

S. Seki and H. Hasegawa, “Analysis of crosstalk in very high-speed LSI/VLSIs using a coupled multiconductor MIS microstrip line model,” IEEE Trans. Microwave Theory and Technique 32(12), 1715–1720 (1984).
[Crossref]

He, S.

Hibbins, A. P.

A. P. Hibbins, B. R. Evans, and J. R. Sambles, “Experimental verification of designer Surface plasmons,” Science 308, 670–672 (2005).
[Crossref] [PubMed]

Howard, L. H.

S. H. Hall and L. H. Howard, Advanced Signal Integrity for High-Speed Digital Designs (Wiley-IEEE, 2009).
[Crossref]

Hsieh, I. J.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Huang, W. T.

W. T. Huang, C. H. Lu, and D. B. Lin, “Suppression of crosstalk using serpentine guard trace vias,” Progress In Electromagnetics Research 109, 37–61 (2010).
[Crossref]

Jiang, T.

X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

Jiang, W. X.

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

Jung, H. K.

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

Kami, Y.

F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
[Crossref]

Kao, Y. H.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Kong, J. A.

J. A. Kong, Electromagnetic Wave Theory (Cambridge, 2005).

Koo, S. K.

S. K. Koo, H. S. Lee, and Y. B. Park, “Crosstalk reduction effect of asymmetry stub loaded lines,” Journal of Electromagnetic Waves and Applications 25, 1156–1167 (2011).
[Crossref]

Ladd, D. N.

D. N. Ladd and G. I. Costache, “SPICE simulation used to characterize the cross-talk reduction effect of additional tracks grounded with vias on printed circuit boards,” IEEE Trans. Circuits and Systems II: Analog and Digital Signal 39(6),342–347 (1992).
[Crossref]

Lee, H. B.

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

Lee, H. S.

S. K. Koo, H. S. Lee, and Y. B. Park, “Crosstalk reduction effect of asymmetry stub loaded lines,” Journal of Electromagnetic Waves and Applications 25, 1156–1167 (2011).
[Crossref]

Lee, K.

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

Li, C. C.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Lin, D. B.

W. T. Huang, C. H. Lu, and D. B. Lin, “Suppression of crosstalk using serpentine guard trace vias,” Progress In Electromagnetics Research 109, 37–61 (2010).
[Crossref]

Lin, H. E.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Liu, L.

Liu, W.

F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
[Crossref]

Liu, X. Y.

X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

Lu, C. H.

W. T. Huang, C. H. Lu, and D. B. Lin, “Suppression of crosstalk using serpentine guard trace vias,” Progress In Electromagnetics Research 109, 37–61 (2010).
[Crossref]

Ma, H. F.

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

Maier, S.

S. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007).

Maier, S. A.

S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
[Crossref] [PubMed]

Mallahzadeh, A. R.

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

Martin-Cano, D.

X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
[Crossref]

D. Martin-Cano, M. L. Nesterov, A. I. Fernandez-Dominguez, F. J. Garcia-Vidal, L. Martin-Moreno, and Esteban Moreno, “Domino plasmons for subwavelength terahertz circuitry,” Opt. Express 18(2), 754–764 (2010).
[Crossref] [PubMed]

Martin-Moreno, L.

D. Martin-Cano, M. L. Nesterov, A. I. Fernandez-Dominguez, F. J. Garcia-Vidal, L. Martin-Moreno, and Esteban Moreno, “Domino plasmons for subwavelength terahertz circuitry,” Opt. Express 18(2), 754–764 (2010).
[Crossref] [PubMed]

S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, “Terahertz surface plasmon-polariton propagation and focusing on periodically corrugated metal wires,” Phys. Rev. Lett. 97, 176805 (2006).
[Crossref] [PubMed]

J. B. Pendry, L. Martin-Moreno, and F. J. Garcia-Vidal, “Mimicking surface plasmons with structured surfaces,” Science 305, 847–848 (2004).
[Crossref] [PubMed]

Moreno, Esteban

Nesterov, M. L.

Park, H. J.

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

Park, Y. B.

S. K. Koo, H. S. Lee, and Y. B. Park, “Crosstalk reduction effect of asymmetry stub loaded lines,” Journal of Electromagnetic Waves and Applications 25, 1156–1167 (2011).
[Crossref]

Pendry, J. B.

J. B. Pendry, L. Martin-Moreno, and F. J. Garcia-Vidal, “Mimicking surface plasmons with structured surfaces,” Science 305, 847–848 (2004).
[Crossref] [PubMed]

Rahmati, B.

A. R. Mallahzadeh, A. Ghasemi, S. Akhlaghi, B. Rahmati, and R. Bayderkhani, “Crosstalk reduction using step shaped transmission line,” Prog. Electromagnetics Res. C 12, 139–148 (2010).
[Crossref]

Saenz, J. J.

F. J. Garca De Abajo and J. J. Saenz, “Electromagnetic surface modes in structured perfect-conductor surfaces,” Phys. Rev. Lett. 95, 233901 (2005).
[Crossref]

Sambles, J. R.

A. P. Hibbins, B. R. Evans, and J. R. Sambles, “Experimental verification of designer Surface plasmons,” Science 308, 670–672 (2005).
[Crossref] [PubMed]

Seki, S.

S. Seki and H. Hasegawa, “Analysis of crosstalk in very high-speed LSI/VLSIs using a coupled multiconductor MIS microstrip line model,” IEEE Trans. Microwave Theory and Technique 32(12), 1715–1720 (1984).
[Crossref]

Shen, L. F.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Shen, X.

X. Shen, T. J. Cui, D. Martin-Cano, and F. J. Garcia-Vidal, “Conformal surface plasmons propagating on ultrathin and flexible films,” Proc. Nat. Acad. Sci. USA 110(1), 40–45 (2013).
[Crossref]

Shen, X. P.

H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
[Crossref]

Sim, J. Y.

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

Smith, C. E.

S. Dai, A. Z. Elsherbeni, and C. E. Smith, “Nonuniform FDTD formulation for the analysis and reduction of crosstalk on coupled microstrip lines,” J. Electromagnetic Waves Applications 10, 1663–1682 (1996).
[Crossref]

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J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Wu, J. J.

J. J. Wu, “Subwavelength microwave guiding by periodically corrugated strip line,” Progress In Electromagnetics Research 104, 113–123 (2010).
[Crossref]

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

Xiao, F.

F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
[Crossref]

Yang, T. J.

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

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J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
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X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

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X. Y. Liu, Y. F. Feng, B. Zhu, J. Zhao, and T. Jiang, “High-order modes of spoof surface plasmonic wave transmission on thin metal film structure,” Opt. Express 21(23), 3155–3165 (2013).

Electronics Letters (1)

J. J. Wu, Y. H. Kao, H. E. Lin, T. J. Yang, D. C. Tsai, H. J. Chang, C. C. Li, I. J. Hsieh, L. F. Shen, and X. F. Zhang, “Crosstalk reduction between metal-strips with subwavelength periodically corrugated structure,” Electronics Letters 16(18), 1273–1274 (2010).
[Crossref]

IEEE Trans. Advanced Packaging (1)

K. Lee, H. B. Lee, H. K. Jung, J. Y. Sim, and H. J. Park, “A serpentine guard trace to reduce the far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines,” IEEE Trans. Advanced Packaging 31 (4), 809–817 (2008).
[Crossref]

IEEE Trans. Circuits and Systems II: Analog and Digital Signal (1)

D. N. Ladd and G. I. Costache, “SPICE simulation used to characterize the cross-talk reduction effect of additional tracks grounded with vias on printed circuit boards,” IEEE Trans. Circuits and Systems II: Analog and Digital Signal 39(6),342–347 (1992).
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F. Xiao, W. Liu, and Y. Kami, “Analysis of crosstalk between finite-length microstrip lines FDTD approach and circuit-concept modeling,” IEEE Trans. Electromagnetic Compatibility 43(4), 573–578 (2001).
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IEEE Trans. Microwave Theory and Technique (1)

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H. F. Ma, X. P. Shen, Q. Cheng, W. X. Jiang, and T. J. Cui, “Broadband and high-efficiency conversion from guided waves to spoof surface plasmon polaritons,” Laser Photonics Rev. 8, 146–151 (2014).
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Figures (6)
Fig. 1
Fig. 1 The structures of the spoof SPPs based differential microstrip lines (a) with symmetric periodic corrugations (SPC), (b) with unilateral periodic corrugations (UPC). The width of the microstrip lines is w, the lattice constant is d, the groove depth is b, the groove width is a = d/2, the spacing between two microstrip lines is w1, the thickness of the substrate is h = 0.508 mm, the thickness of microstrip lines is t = 0.0175 mm and the relative dielectric constant εr = 3.37 for RO4003.

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Fig. 2
Fig. 2 (a) Odd mode dispersion lines of symmetric periodic corrugated (SPC) differential microstrip lines with different lattice constants d = 0.5 mm, 1 mm, 2 mm when b = 0.3w. (b) Odd mode dispersion lines of unilateral periodic corrugated (UPC) differential microstrip lines with different lattice constants d = 0.5 mm, 1 mm, 2 mm when b = 0.6w. (c) and (d) Magnetic modal field distributions on the horizontal plane (xy plane) beneath the SPC differential microstrip lines and magnetic modal field distributions on the central vertical plane (zx plane) of the SPC differential microstrip lines with d = 1 mm at asymptotic frequency, respectively. (e) and (f) Magnetic modal field distributions on the horizontal plane (xy plane) beneath the UPC differential microstrip lines and magnetic modal field distributions on the central vertical plane (zx plane) of the UPC differential microstrip lines with d = 1 mm at asymptotic frequency, respectively.

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Fig. 3
Fig. 3 The normalized propagation lengths of spoof SPPs in periodic corrugated differential microstrip lines with different lattice constants. (a) For the SPC differential microstrip lines. (b) For the UPC differential microstrip lines

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Fig. 4
Fig. 4 (a) Schema for the microstrip coupler composed by the SPC differential microstrip lines and the single ended microstrip line with b = 0.3w, w = w1 = w2 = 1.2mm and L = 10cm. The other parameters are the same as those in Fig. 1(a). (b) Schema for the UPC coupler with b = 0.6w, w = w1 = w2 = 1.2mm and L = 10cm. The other parameters are the same as those in Fig. 1(b). (c) and (d) Simulated Sdd21 and Ssd41 for the SPC and UPC couplers with two different lattice constants d = 1mm (short-dashed line) and d = 2 mm (dot-dashed line), respectively. Simulated S parameters for the conventional case (i.e. b = 0 mm) is also presented in solid line. (e) Simulated electric field distributions beneath the conventional, SPC and UPC differential microstrip lines with d = 1 mm at 8GHz. (f) and (g) Simulated conversion coefficient Scd21 between the differential signal and the common mode signal in the SPC and UPC couplers for d = 1 mm (short-dashed line) and d = 2 mm (dot-dashed line), respectively. Simulated conversion coefficient for the conventional case is presented in solid line.

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Fig. 5
Fig. 5 (a), (b) and (c) The experimental microstrip couplers for the SPC, UPC and conventional cases, respectively. The geometric parameters of the differential microstrip lines are the same as those in Figs. 4(a) and 4(b). The grooves changes gradually at the junctions between the corrugated differential microstrip lines and the ordinary microstrip lines to minimize reflection. (d) and (e) Measured S parameters for the SPC and UPC couplers with d = 1 mm (short-dashed line) and d = 2 mm (dot-dashed line), respectively. The measured S parameters of the conventional case are also presented in solid line. (f) and (g) Measured conversion coefficient in the experimental SPC, UPC and conventional couplers.

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Fig. 6
Fig. 6 (a) Measured input time domain signal at Port1. (b) Measured far end crosstalk between the SPC differential microstrip lines and the single ended microstrip line with d = 1 mm (short-dashed line) and d = 2 mm (dot-dashed line). (c) The far end crosstalk for the UPC coupler with d = 1 mm (short-dashed line) and d = 2 mm (dot-dashed line). The crosstalk for the conventional case is presented in solid line.

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Tables (2)

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Table 1 Simulated S parameters for conventional, SPC and UPC cases at 12 GHz

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Table 2 Measured S parameters for the conventional, SPC and UPC couplers at 12 GHz

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Equations (3)

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P d = 1 2 Re ∬ E → × H → * ⋅ n → d s = 1 2 Re ( η m ) ∬ | H → | 2 d s
α = 1 2 d P d P f
L = 1 / ( 2 α )

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