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Nonmechanical grating-generated scanning coherence microscopy

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Abstract

A novel method of coherence microscopy with a grating-generated delay line is demonstrated to produce depth-lateral images without axial or lateral scanning. A new image-reconstruction approach based on random phase modulation of the reference beam is realized. The depth-lateral reflections of test objects are digitally reconstructed with a simple algorithm.

© 1998 Optical Society of America

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