Abstract

We present the performance limits on three-dimensional (3D) localization accuracy of currently used methods of wide-field superlocalization microscopy. The three methods investigated are double-helix microscopy, astigmatic imaging, and biplane detection. In the shot-noise limit, Cramer–Rao lower bound calculations show that, among these techniques, the double-helix microscope exhibits the best axial and 3D localization accuracy over short as well as long depth-of-field systems. The fundamental advantage of engineered point-spread function systems, like the double-helix, stems from the additional degrees of freedom available to control diffraction in three dimensions over variable regions of interest.

© 2010 Optical Society of America

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