Abstract

We present a new method to measure the frequency noise and modulation response of the carrier-envelope offset (CEO) beat of an optical frequency comb that does not make use of the traditional $f$-to-$2f$ interferometry. Instead, we use an appropriate combination of different signals to extract the contribution of the CEO frequency without directly detecting it. We present a proof-of-principle validation realized with a commercial Er:fiber frequency comb and show an excellent agreement with the results obtained using a standard $f$-to-$2f$ interferometer. This approach is attractive for the characterization of novel frequency comb technologies for which self-referencing is challenging, such as semiconductor mode-locked lasers, microresonator-based systems, or GHz repetition rate lasers.

© 2015 Optical Society of America

First investigation of the noise and modulation properties of the carrier-envelope offset in a modelocked semiconductor laser

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