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Abstract
We present a corrigendum to our Letter [Opt. Lett. 35, 703 (2010) [CrossRef] ]. In the original Letter we inadvertently included in Fig. 2(a) a TEM micrograph corresponding to a different, but very similar, sample. This corrigendum replaces Fig. 2(a) with a correct version. Since the main results are rather based in optical absorption measurements, and their modeling by using the T-matrix method, this correction does not affect the results and conclusions of the original Letter.
© 2023 Optica Publishing Group
Our original Letter [1] inadvertently included in Fig. 2(a) a TEM micrograph corresponding to a different, but very similar, sample. Figure 1 in this corrigendum replaces the original Fig. 2.
Fig. 1. Z-scan mode TEM micrographs obtained (a) before and (b) after the postdeformation annealing.
The likeness of the new figure and the previous one is so high that it explains the involuntary mistake committed for the original submission. Since the main results of the paper are obtained by measuring and modelling the optical absorption of our nanocomposites, and this micrograph is rather a supporting information, the results and conclusions of the original Letter are not affected by the correction.
Acknowledgments
The authors thank K. López and F. J. Jaimes for the IF-UNAM Pelletron accelerator operation and L. Rendón-Vázquez for TEM assistance. V. Rodríguez-Iglesias, H. G. Silva-Pereyra, and O. Peña-Rodríguez are grateful to DGEP-UNAM, CONACyT, and UNAM-CSIC, respectively, for financial support.
Disclosures
The authors declare no conflicts of interest.
Data availability
No data were generated or analyzed in the presented research.
REFERENCES
1. V. Rodríguez-Iglesias, O. Peña-Rodríguez, H. G. Silva-Pereyra, L. Rodríguez-Fernández, J. C. Cheang-Wong, A. Crespo-Sosa, J. A. Reyes-Esqueda, and A. Oliver, Opt. Lett. 35, 703 (2010). [CrossRef]
