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Optica Publishing Group

Accuracy-enhanced ultra-wideband optoelectronic frequency response measurement via residual carrier de-embedding and sideband power correction

Yuqing Heng, qi wang, Jianbin Fu, Xingbang Zhu, Min Xue, and Shilong Pan

This paper has been accepted for publication. The DOI 10.1364/OL.613747 has been registered for this article. Authors and readers can cite the DOI and will redirect to the published article when available. Please note that the title and author listing will be updated when the published article is available.
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