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Carrier diffusion measurements in InSb by the angular dependence of degenerate four-wave mixing

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Abstract

Studies of the angular dependence of cw degenerate four-wave mixing in n-type InSb have yielded a value for the diffusion length, lD, of 60 ± 2 μm. From this, the dependence of lD on photoexcited carrier concentration is calculated. A simple model has been developed to estimate the corresponding parallel-processing capabilities of semiconductor-based, all-optical, parallel-processing digital computing systems.

© 1985 Optical Society of America

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