Abstract

Optical polarization changes and mode coupling due to spatially varying anisotropic perturbations in ∊ caused by electro-optic, acousto-optic, and other effects have been widely studied for both plane-wave and fiber mode propagation. A new optical S-parameter analysis of these effects, applicable to arbitrary optical field distributions, is presented. It is applied to evaluating the performance of the longitudinal electro-optic probe used for noninvasively examining GaAs integrated circuits. Error in probe measurements of circuit voltage distributions can be characterized by considering the probe as a scanned electro-optic spatial filter.

© 1987 Optical Society of America

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