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Holographic interferometry using anisotropic self-diffraction in Bi12SiO20

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Abstract

Anisotropic self-diffraction in photorefractive Bi12SiO20 crystals is applied to the investigation of dynamic holographic recording through the diffusion process. Specific attention is paid to optimization of experimental parameters for real-time holographic interferometry. The resultant interferometer is applied to obtain both time-average and double-exposure interferograms of vibrating and displaced structures.

© 1991 Optical Society of America

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