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Surface second-harmonic generation in Si(111) for autocorrelation measurements of 248-nm femtosecond pulses

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Abstract

124-nm radiation by surface second-harmonic generation was used to measure the pulse-width autocorrelation of femtosecond 248-nm pulses. Second-order autocorrelation was obtained for input fluences as high as 0.01 J/cm2. At higher input fluences, autocorrelation of higher order is observed.

© 1993 Optical Society of America

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