Abstract

We measure the intensity and phase of ultrashort pulses from a self-mode-locked Ti:sapphire laser using the recently developed technique of frequency-resolved optical gating. These results represent to our knowledge the shortest complete optical waveform characterization measurements performed to date. We also verify recent theoretical calculations that predict that the main limitation on the pulse duration from these lasers is the presence of uncompensated higher-order dispersion.

© 1995 Optical Society of America

Frequency-resolved optical-gating measurements of ultrashort pulses using surface third-harmonic generation

Thomas Tsang, Marco A. Krumbügel, Kenneth W. DeLong, David N. Fittinghoff, and Rick Trebino
Opt. Lett. 21(17) 1381-1383 (1996)

Ultrashort-pulse measurement using noninstantaneous nonlinearities: Raman effects in frequency-resolved optical gating

Kenneth W. DeLong, Celso L. Ladera, Rick Trebino, Bern Kohler, and Kent R. Wilson
Opt. Lett. 20(5) 486-488 (1995)

Noise sensitivity in frequency-resolved optical-gating measurements of ultrashort pulses

David N. Fittinghoff, Kenneth W. DeLong, Rick Trebino, and Celso L. Ladera
J. Opt. Soc. Am. B 12(10) 1955-1967 (1995)

Single-shot measurement of the intensity and phase of an arbitrary ultrashort pulse by using frequency-resolved optical gating

Daniel J. Kane and Rick Trebino
Opt. Lett. 18(10) 823-825 (1993)

Phase and intensity characterization of femtosecond pulses from a chirped-pulse amplifier by frequency-resolved optical gating

Bern Kohler, Vladislav V. Yakovlev, Kent R. Wilson, Jeff Squier, Kenneth W. DeLong, and Rick Trebino
Opt. Lett. 20(5) 483-485 (1995)