Abstract

We have developed a novel method of time-of-flight (TOF) photoelectron spectroscopy that permits observation of multiphoton ionizations with extremely high precision, especially for low-probability events. By scanning the laser-produced ionization region across a pinhole we can select specific laser peak intensities. The volumes occupied by low intensities rise rapidly compared with traditional straight TOF spectroscopy, resulting in high signal gains. This technique presents a new way of observing fundamental laser–matter interactions.

© 1996 Optical Society of America

Observation of a critical concentration in laser-induced transparency and multiphoton excitation and ionization in rubidium

Lu Deng, W. R. Garrett, M. G. Payne, and D. Z. Lee
Opt. Lett. 21(13) 928-930 (1996)

Measurement of the local laser intensity by photoelectron energy shifts in multiphoton ionization

M. D. Perry, O. L. Landen, and A. Szöke
J. Opt. Soc. Am. B 6(3) 344-349 (1989)

Population trapping in short-pulse multiphoton ionization

Mark Edwards and Charles W. Clark
J. Opt. Soc. Am. B 13(1) 101-112 (1996)

Line narrowing and photoelectron trapping in multiphoton ionization spectroscopy

Z. Deng
J. Opt. Soc. Am. B 1(6) 874-878 (1984)

First ionization potentials of tungsten and rhenium by mass-selected double-resonance ionization spectroscopy

Margot D. Campbell-Miller and Benoit Simard
J. Opt. Soc. Am. B 13(10) 2115-2120 (1996)