Abstract

A novel scanning probe technique that is able to image surface magnetic and electric properties has been developed. It is based on the near-field microscopy of surface second-harmonic generation. We have demonstrated the capability of the technique by imaging the domain structure of a Ni single crystal and a piezoelectric ceramic.

© 1997 Optical Society of America

Near-field second-harmonic microscopy of thin ferroelectric films

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Highly efficient second-harmonic nanosource for near-field optics and microscopy

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