Abstract
We report the application of electric-field-induced optical second-harmonic
generation as a new technique for measuring the field of freely propagating
terahertz radiation. Using silicon as the nonlinear medium, we demonstrate
subpicosecond time resolution and a sampling signal that varies linearly with
the terahertz electric field. This approach, which is attractive for centrosymmetric
media, permits a significantly broadened class of materials to be exploited
for free-space sampling measurements.
© 1998 Optical Society of America
Full Article |
PDF Article
More Like This
References
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (3)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (3)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription