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Measurement of the vector character of electric fields by optical second-harmonic generation

J. I. Dadap, J. Shan, A. S. Weling, J. A. Misewich, A. Nahata, and T. F. Heinz

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Abstract

We present a scheme for the determination of the vector nature of an electric field by optical second-harmonic generation. We demonstrate the technique by mapping the two-dimensional electric-field vector of a biased transmission line structure on silicon with a spatial resolution of ∼10 µm.

© 1999 Optical Society of America

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