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Sampled-speckle photography for measurement of deformation

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Abstract

Speckles usually are of two kinds: laser speckle and white-light speckle. An additional kind, termed a sampled speckle, is proposed. Whereas laser speckles arise from multiple interference of light scattered from an object illuminated by a coherent laser beam and white-light speckles are a physically generated speckle pattern on the surface of the object, sampled speckles are generated as a result of the sampling of a digital image. The generation of these speckles and their application to displacement measurement are demonstrated.

© 2000 Optical Society of America

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