Abstract
We present a novel interferometric technique for performing ellipsometric
measurements. This technique relies on the use of a nonclassical optical source,
namely, polarization-entangled twin photons generated by spontaneous parametric
downconversion from a nonlinear crystal, in conjunction with a coincidence-detection
scheme. Ellipsometric measurements acquired with this scheme are absolute;
i.e., they do not require source and detector calibration.
© 2001 Optical Society of America
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