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Near-field probing of active photonic-crystal structures

D. Gérard, L. Berguiga, F. de Fornel, L. Salomon, C. Seassal, X. Letartre, P. Rojo-Romeo, and P. Viktorovitch

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Abstract

We report a study of the optical near field of an active integrated component operating near the 1.55‐µm telecommunications wavelength. The device is based on a two-dimensional photonic crystal etched in a suspended InP membrane. Topographic as well as optical information is collected by use of a scanning near-field optical microscope in collection mode, providing information about the local distribution of the losses.

© 2002 Optical Society of America

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