Abstract

The interference pattern produced by irradiation of a pair of pinholes with a beam contains information on both the spatial and the temporal coherence properties of the beam, as well as its power spectrum. We demonstrate experimentally for what is believed to be the first time that the spectrum of an extreme-ultraviolet (EUV) beam can be obtained from a measurement of the interference pattern produced by a pinhole pair. This approach offers a convenient method of making absolute wavelength and relative spectral intensity calibrations in the EUV.

© 2002 Optical Society of America

Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer

Chang Chang, Erik Anderson, Patrick Naulleau, Eric Gullikson, Kenneth Goldberg, and David Attwood
Opt. Lett. 27(12) 1028-1030 (2002)

Highly coherent light at 13 nm generated by use of quasi-phase-matched high-harmonic generation

X. Zhang, A. R. Libertun, A. Paul, E. Gagnon, S. Backus, I. P. Christov, M. M. Murnane, H. C. Kapteyn, R. A. Bartels, Y. Liu, and D. T. Attwood
Opt. Lett. 29(12) 1357-1359 (2004)

Wave-front phase measurements of high-order harmonic beams by use of point-diffraction interferometry

D. G. Lee, J. J. Park, J. H. Sung, and C. H. Nam
Opt. Lett. 28(6) 480-482 (2003)

Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement

Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, and Katsumi Midorikawa
Opt. Lett. 32(6) 722-724 (2007)

High-harmonic-generation spectrum reconstruction from Young's double-slits interference pattern using the maximum entropy method

Ruben A. Dilanian, Bo Chen, Sven Teichmann, Lap V. Dao, Harry M. Quiney, and Keith A. Nugent
Opt. Lett. 33(20) 2341-2343 (2008)