Abstract

We propose a novel method for completely characterizing ultrashort pulses at extreme-ultraviolet (XUV) wavelengths by adapting the technique of spectral phase interferometry for direct electric-field reconstruction to this spectral region. Two-electron wave packets are coherently produced by photoionizing atoms with two time-delayed replicas of the XUV pulse. For one of the XUV pulses, photoionization occurs in the presence of a strong infrared pulse that ponderomotively shifts the binding energy, thereby providing the spectral shear needed for reconstruction of the spectral phase of the XUV pulse.

© 2003 Optical Society of America

Implementation of electro-optic spectral shearing interferometry for ultrashort pulse characterization

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