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Fabric inspection by near-infrared machine vision

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Abstract

Fabrics that have superstructures of colored squares, bands, etc., superimposed upon the basic web structure can be advantageously analyzed by use of near-infrared (NIR) illumination and a conventional monochrome camera. The reduction in contrast of the superstructure signal in the NIR image facilitates inspection of the fabric’s structure and defect segmentation. Underdetection and misdetection errors are noticeably reduced. This inspection takes advantage of the residual sensitivity of a monochrome camera, which can reach 1000 nm. The light source is an array of NIR LEDs emitting in a band to which the camera is still sensitive. NIR visual inspection can be performed by machines or by humans. In the latter case the observer looks at the NIR image of the fabric displayed on a TV monitor.

© 2004 Optical Society of America

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