Abstract

We propose a new method for enhancing the sensitivity of the reflectance spectrum to the scattering feature of the superficial tissue layer. This method is based on multiple-discriminant analysis in the eigensubspace of the spectrum. Considering the application of scattering imaging, we evaluated this method by performing multispectral imaging of two-layered tissue phantoms. A color map converted from the spectral reflectance corresponds well to variations in the size of the scattering in the first layer.

© 2004 Optical Society of America

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