Abstract
We present experimental results for what is to our knowledge the first spectral-hole-burning based rf spectrum analyzer to cover of rf analysis bandwidth. The rf signal of interest is modulated onto an optical carrier, and the resultant optical sidebands are burned into the inhomogeneously broadened absorption band of a crystal. At the same time a second, frequency-swept laser reads out the absorption profile, which is a double-sideband replica of the rf spectrum, and thus the rf spectrum can be deduced after spectral calibration of the nonlinear readout chirp. This initial demonstration shows spectral analysis covering of bandwidth with spectral channels and provides of dynamic range.
© 2005 Optical Society of America
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