Abstract

We report an accurate method to measure the group-velocity dispersion (GVD) of transparent materials by use of spectrally resolved phase-shifting interferometry. The GVD of silica glass slide measured using an eight-step phase-shifting algorithm agrees well with that calculated using the Sellmeier dispersion equation over the entire visible wavelength region, with a rms error of $\le 0.0036\mathrm{\mu }{\mathrm{m}}^{-2}$, better than that of other measurement methods reported so far.

© 2006 Optical Society of America

Spectrally resolved phase-shifting interferometry of transparent thin films: sensitivity of thickness measurements

Sanjit K. Debnath, Mahendra P. Kothiyal, Joanna Schmit, and Parameswaran Hariharan
Appl. Opt. 45(34) 8636-8640 (2006)

Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates

Sanjit K. Debnath, Mahendra P. Kothiyal, Joanna Schmit, and Parameswaran Hariharan
Opt. Express 14(11) 4662-4667 (2006)

Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry

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Appl. Opt. 45(27) 6965-6972 (2006)

Group-delay measurement on laser mirrors by spectrally resolved white-light interferometry

A. P. Kovács, K. Osvay, Zs. Bor, and R. Szipöcs
Opt. Lett. 20(7) 788-790 (1995)

Group refractive index and group velocity dispersion measurement by complex master slave interferometry

Sylvain Rivet, Adrian Bradu, Fiona Bairstow, Hisham Forrière, and Adrian Podoleanu
Opt. Express 26(17) 21831-21842 (2018)