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Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

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Abstract

A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of >10ps with 25fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization.

© 2007 Optical Society of America

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