Abstract
We measured linear and quadratic dispersion on millimeter-length fibers, waveguides, and nanowires based on common-path spectral interferometry. We obtained the linear dispersion parameter, , with a relative precision of , and extracted the quadratic dispersion parameter, , from the Taylor expansion of . values show a discrepancy of when compared with simulation as well as with measurement results obtained by a conventional Michelson interferometer. Using this method, we experimentally confirmed the sign inversion of the group velocity dispersion of nanowires for what is believed to be the first time.
© 2007 Optical Society of America
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