Abstract

We describe a measurement method of refractive indices by way of spectrally resolved interferometry using a femtosecond pulse laser. The method is dispersion insensitive and requires no prior precise knowledge of the geometrical thickness of the specimen. Not only the group but also the phase refractive index can be determined over the wide spectral range covered by the optical comb of the femtosecond pulse laser in use.

© 2007 Optical Society of America

Measurement of transient nonlinear refractive index in gases using xenon supercontinuum single-shot spectral interferometry

Y.-H. Chen, S. Varma, I. Alexeev, and H. M. Milchberg
Opt. Express 15(12) 7458-7467 (2007)

Direct measurement of the group refractive index of air with interferometry between adjacent femtosecond pulses

Yoshihisa Yamaoka, Kaoru Minoshima, and Hirokazu Matsumoto
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Needle-based refractive index measurement using low-coherence interferometry

Adam M. Zysk, Steven G. Adie, Julian J. Armstrong, Matthew S. Leigh, Alexandre Paduch, David D. Sampson, Freddy T. Nguyen, and Stephen A. Boppart
Opt. Lett. 32(4) 385-387 (2007)

Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser

Ki-Nam Joo and Seung-Woo Kim
Opt. Express 14(13) 5954-5960 (2006)

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser

Saerom Maeng, Jungjae Park, Byungsun O, and Jonghan Jin
Opt. Express 20(11) 12184-12190 (2012)