Abstract
Tip-enhanced Raman spectroscopy with a spatial resolution of is conducted on a sample of graphite that has been exposed to a focused Ga ion beam with a diameter of . The G mode located at does not exhibit a measurable tip enhancement, while the D mode at is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
© 2009 Optical Society of America
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