Abstract

The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated.

© 2010 Optical Society of America

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

Emre Coşkun, Kıvanç Sel, Serhat Özder, and Mustafa Kurt
Appl. Opt. 47(27) 4888-4894 (2008)

Determination of birefringence dispersion in nematic liquid crystals by using an S-transform

Serhat Özder, Emre Coskun, Oguz Köysal, and Özlem Kocahan
Opt. Lett. 32(14) 2001-2003 (2007)

Extraction of phase derivative data from interferometer images using a continuous wavelet transform to determine two-dimensional refractive index profiles

R. Oven
Appl. Opt. 49(22) 4228-4236 (2010)

Determination of the Refractive Index of Thin Dielectric Films*

Michael Hacskaylo
J. Opt. Soc. Am. 54(2) 198-203 (1964)

Determination of the refractive index of a bacteriorhodopsin film

Chunping Zhang, Q. Wang Song, Chin-Yu Ku, Richard B. Gross, and Robert R. Birge
Opt. Lett. 19(18) 1409-1411 (1994)