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Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy

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Abstract

We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples with cylindrical symmetry in the presence of photon noise with Poisson statistics. The improvement in comparison to global intensity measurement (i.e., without analyzer) is discussed.

© 2012 Optical Society of America

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