Abstract
We demonstrate a method to increase the sensitivity of the phase shift under total internal reflection (TIR) for optical sensing. This is achieved by the introduction of two simple dielectric layers to the TIR surface of a fused silica prism. The enhanced sensitivity is demonstrated using evanescent-wave cavity-ring-down-ellipsometry by measuring the refractive index of liquid mixtures and by studying the adsorption of polymers to the TIR surface of the fused silica prism.
© 2013 Optical Society of America
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