Abstract

A polarimetric method for the measurement of linear retardance in the presence of phase fluctuations is presented. This can be applied to electro-optic devices behaving as variable linear retarders. The method is based on an extended Mueller matrix model for the linear retarder containing the time-averaged effects of the instabilities. As a result, an averaged Stokes polarimetry technique is proposed to characterize both the retardance and its flicker magnitude. Predictive capability of the approach is experimentally demonstrated, validating the model and the calibration technique. The approach is applied to liquid crystal on silicon displays (LCoS) using a commercial Stokes polarimeter. Both the magnitude of the average retardance and the amplitude of its fluctuation are obtained for each gray level value addressed, thus enabling a complete phase characterization of the LCoS.

© 2014 Optical Society of America

Averaged Stokes polarimetry applied to evaluate retardance and flicker in PA-LCoS devices

Francisco J. Martínez, Andrés Márquez, Sergi Gallego, Manuel Ortuño, Jorge Francés, Augusto Beléndez, and Inmaculada Pascual
Opt. Express 22(12) 15064-15074 (2014)

Predictive capability of average Stokes polarimetry for simulation of phase multilevel elements onto LCoS devices

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Opt. Lett. 45(20) 5732-5735 (2020)

Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization

A. Márquez, I. Moreno, C. Iemmi, A. Lizana, J. Campos, and M. J. Yzuel
Opt. Express 16(3) 1669-1685 (2008)

Combining average molecular tilt and flicker for management of depolarized light in parallel-aligned liquid crystal devices for broadband and wide-angle illumination

Andrés Márquez, Francisco J. Martínez-Guardiola, Jorge Francés, Sergi Gallego, Inmaculada Pascual, and Augusto Beléndez
Opt. Express 27(4) 5238-5252 (2019)