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Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

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Abstract

We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically 10nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.

© 2014 Optical Society of America

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