Abstract

A new transmittance measurement setup, based on the use of a tunable laser source and a low-noise scientific-grade CCD camera operating in perfect integration mode, is proposed to achieve the spectrally resolved characterization of thin-film filters with optical densities from 0 to 12 in a wavelength range between 400 and 1000 nm. The first experimental results obtained on dedicated components demonstrate the efficiency of this new measurement scheme.

© 2015 Optical Society of America

Ultra-wide-range measurements of thin-film filter optical density over the visible and near-infrared spectrum

Michel Lequime, Simona Liukaityte, Myriam Zerrad, and Claude Amra
Opt. Express 23(20) 26863-26878 (2015)

Wide-range wavelength and angle resolved light scattering measurement setup

Marin Fouchier, Myriam Zerrad, Michel Lequime, and Claude Amra
Opt. Lett. 45(9) 2506-2509 (2020)

Breakthrough spectrophotometric instrument for the ultra-fine characterization of the spectral transmittance of thin-film optical filters

Michel Lequime, Myriam Zerrad, and Claude Amra
Opt. Express 26(26) 34236-34249 (2018)

High-optical-density out-of-band spectral transmittance measurements of bandpass filters

Z. M. Zhang, L. M. Hanssen, and R. U. Datla
Opt. Lett. 20(9) 1077-1079 (1995)

Thin-film filter, wavelength-locked, multi-laser cavity for dense wavelength beam combining of broad-area laser diode bars

M. Haas, A. Killi, C. Tillkorn, S. Ried, M. Ginter, and H. Zimer
Opt. Lett. 40(17) 3949-3952 (2015)