Abstract

A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as $9.57\times {10}^{-5}{\mathrm{m}}^2/\mathrm{s}$, $11.00\times {10}^{-5}{\mathrm{m}}^2/\mathrm{s}$, and $9.02\times {10}^{-5}{\mathrm{m}}^2/\mathrm{s}$ via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.

© 2015 Optical Society of America

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