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Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin, Jarno N. Van der Kolk, Andrew S. Quigley, Maxime Pinsard, Samuel P. Veres, Laurent Kreplak, Lora Ramunno, and François Légaré

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Abstract

We report on a simple way to directly measure the Gouy phase shift of a strongly focused laser beam. This is accomplished by using a recent technique, namely, interferometric second-harmonic generation. We expect that this method will be of interest in a wide range of research fields, from high-harmonic and attosecond pulse generation to femtochemistry and nonlinear microscopy.

© 2018 Optical Society of America

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Corrections

18 April 2018: A typographical correction was made to paragraph 4 of page 4.

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