Abstract
Double speckle pattern interferometry is presented for the measurement of in-plane rotation angle, sign, and center of rotation. The technique employs two conventional in-plane sensitive electronic speckle pattern interferometry systems combined with two-wavelength laser illumination and a phase-shifting method. Angular displacement of micro-rotation including the sign is determined from the wrapped phase difference, and the center of rotation is located by using wrapped phase difference maps related to two-directional displacement. The test setup is described and experimental results indicate that the system can provide angular displacement measurement with accuracy of 1.8 arcsec.
© 2019 Optical Society of America
Full Article | PDF ArticleMore Like This
N. Krishna Mohan, H. Saldner, and N.-E. Molin
Opt. Lett. 18(21) 1861-1863 (1993)
Min Lu, Shengjia Wang, Laura Aulbach, Martin Jakobi, and Alexander W. Koch
Opt. Lett. 42(10) 1986-1989 (2017)
Yassine Tounsi, Manoj Kumar, Ahmed Siari, Fernando Mendoza-Santoyo, Abdelkrim Nassim, and Osamu Matoba
Opt. Lett. 44(14) 3434-3437 (2019)