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Single-shot, omni-directional x-ray scattering imaging with a laboratory source and single-photon localization

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Abstract

Omni-directional, ultra-small-angle x-ray scattering imaging provides a method to measure the orientation of micro-structures without having to resolve them. In this letter, we use single-photon localization with the Timepix3 chip to demonstrate, to the best of our knowledge, the first laboratory-based implementation of single-shot, omni-directional x-ray scattering imaging using the beam-tracking technique. The setup allows a fast and accurate retrieval of the scattering signal using a simple absorption mask. We suggest that our new approach may enable faster laboratory-based tensor tomography and could be used for energy-resolved x-ray scattering imaging.

© 2020 Optical Society of America

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