Abstract

The anisotropic optical dielectric functions of slanted columnar layers fabricated using polymethacrylate based stereolithography are reported for the terahertz-frequency domain using generalized spectroscopic ellipsometry. The slanted columnar layers are composed of spatially coherent columnar structures with a diameter of 100 µm and a length of 700 µm that are tilted by 45° with respect to the surface normal of the substrates. A simple biaxial (orthorhombic) layer homogenization approach is used to analyze the terahertz ellipsometric data obtained at three different sample azimuthal orientations. The permittivity along the major polarizability directions varies by almost 25%. Our results demonstrate that stereolithography allows tailoring of the polarizability and anisotropy of the host material, and provides a flexible alternative metamaterials fabrication method for the terahertz spectral range.

© 2020 Optical Society of America

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