Abstract

Exceptional points (EPs) in the polarization space were observed in reflection on helically structured thin films. These films have form anisotropy at the nanoscale introduced through dynamic control of crystalline growth geometry by changing the orientation of the substrate with respect to the impinging vapor. They are simpler alternatives to metasurfaces, because they can be produced at low cost using conventional thin-film deposition techniques. The EPs were experimentally confirmed by eigenstate swapping on a closed circuit surrounding them and were predicted by numerical calculations. Reflective surfaces operating at an EP could be used to make ultrasensitive sensors.

© 2021 Optical Society of America

Polarization eigenstates analysis of helically structured thin films

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