Abstract

A novel, to the best of our knowledge, compact, self-aligned focusing schlieren system is presented that eliminates the need for a separate source grid and cutoff grid. A single grid element serves both to generate a projected source grid onto a retroreflective background and act as the cutoff grid for the reflected light. This is made possible by manipulating the polarization of light through the system. The use of only a single grid element eliminates the need to create a cutoff grid that is perfectly matched and scaled to the source grid, and removes the need to align the source and cutoff grids to each other. The sensitivity to density objects is adjustable with the use of a polarizing prism. Images obtained with this system show operation similar to existing focusing schlieren systems, but with much reduced complexity and setup time. Images taken with acrylic windows placed normal to the optical axis further demonstrate the system’s utility for wind tunnel measurements.

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References

  • View by:

  1. G. S. Settles, Schlieren and Shadowgraph Techniques (Springer, 2001).
  2. L. M. Weinstein, AIAA J. 31, 1250 (1993).
    [Crossref]
  3. L. M. Weinstein, Eur. Phys. J. Spec. Top. 182, 65 (2010).
    [Crossref]
  4. J. T. Heineck, “Retroreflection focusing schlieren system,” U.S. patent5,515,158 (7May1996).
  5. A. F. Fagan, D. L’Esperance, and K. Q. Zaman, in 30th AIAA Aerodynamic Measurement Technology and Ground Testing Conference (2014), paper 2014-2522.
  6. B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
    [Crossref]
  7. D. L’Esperance and B. D. Buckner, Proc. SPIE 10373, 103730R (2017).
    [Crossref]
  8. B. D. Buckner and D. L’Esperance, Proc. SPIE 11102, 111020R (2019).
    [Crossref]
  9. MetroLaser Inc., http://www.metrolaserinc.com/technologies/high-speed-schlieren/ .
  10. Handbook of Optics: Devices, Measurements, and Properties, M. Bass, ed., 2nd ed., Vol. 2, (McGraw-Hill, 1995).

2019 (1)

B. D. Buckner and D. L’Esperance, Proc. SPIE 11102, 111020R (2019).
[Crossref]

2017 (1)

D. L’Esperance and B. D. Buckner, Proc. SPIE 10373, 103730R (2017).
[Crossref]

2015 (1)

B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
[Crossref]

2010 (1)

L. M. Weinstein, Eur. Phys. J. Spec. Top. 182, 65 (2010).
[Crossref]

1993 (1)

L. M. Weinstein, AIAA J. 31, 1250 (1993).
[Crossref]

Buckner, B. D.

B. D. Buckner and D. L’Esperance, Proc. SPIE 11102, 111020R (2019).
[Crossref]

D. L’Esperance and B. D. Buckner, Proc. SPIE 10373, 103730R (2017).
[Crossref]

B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
[Crossref]

Fagan, A. F.

A. F. Fagan, D. L’Esperance, and K. Q. Zaman, in 30th AIAA Aerodynamic Measurement Technology and Ground Testing Conference (2014), paper 2014-2522.

Heineck, J. T.

J. T. Heineck, “Retroreflection focusing schlieren system,” U.S. patent5,515,158 (7May1996).

L’Esperance, D.

B. D. Buckner and D. L’Esperance, Proc. SPIE 11102, 111020R (2019).
[Crossref]

D. L’Esperance and B. D. Buckner, Proc. SPIE 10373, 103730R (2017).
[Crossref]

B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
[Crossref]

A. F. Fagan, D. L’Esperance, and K. Q. Zaman, in 30th AIAA Aerodynamic Measurement Technology and Ground Testing Conference (2014), paper 2014-2522.

Settles, G. S.

G. S. Settles, Schlieren and Shadowgraph Techniques (Springer, 2001).

Trolinger, J. D.

B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
[Crossref]

Weinstein, L. M.

L. M. Weinstein, Eur. Phys. J. Spec. Top. 182, 65 (2010).
[Crossref]

L. M. Weinstein, AIAA J. 31, 1250 (1993).
[Crossref]

Zaman, K. Q.

A. F. Fagan, D. L’Esperance, and K. Q. Zaman, in 30th AIAA Aerodynamic Measurement Technology and Ground Testing Conference (2014), paper 2014-2522.

AIAA J. (1)

L. M. Weinstein, AIAA J. 31, 1250 (1993).
[Crossref]

Eur. Phys. J. Spec. Top. (1)

L. M. Weinstein, Eur. Phys. J. Spec. Top. 182, 65 (2010).
[Crossref]

Proc. SPIE (3)

B. D. Buckner, J. D. Trolinger, and D. L’Esperance, Proc. SPIE 9576, 95760C (2015).
[Crossref]

D. L’Esperance and B. D. Buckner, Proc. SPIE 10373, 103730R (2017).
[Crossref]

B. D. Buckner and D. L’Esperance, Proc. SPIE 11102, 111020R (2019).
[Crossref]

Other (5)

MetroLaser Inc., http://www.metrolaserinc.com/technologies/high-speed-schlieren/ .

Handbook of Optics: Devices, Measurements, and Properties, M. Bass, ed., 2nd ed., Vol. 2, (McGraw-Hill, 1995).

J. T. Heineck, “Retroreflection focusing schlieren system,” U.S. patent5,515,158 (7May1996).

A. F. Fagan, D. L’Esperance, and K. Q. Zaman, in 30th AIAA Aerodynamic Measurement Technology and Ground Testing Conference (2014), paper 2014-2522.

G. S. Settles, Schlieren and Shadowgraph Techniques (Springer, 2001).

Data Availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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Figures (3)

Fig. 1.
Fig. 1. Schematic of compact, self-aligned focusing schlieren concept.
Fig. 2.
Fig. 2. Baseline focusing schlieren images of a helium jet (without the PP installed) at several positions relative to the focal plane both (a) without and (b) with windows placed in the field of view. The camera exposure is 10 µs, and the nozzle outer diameter is ${D_{\rm{N}}} = 1.7 \;{\rm{mm}}$.
Fig. 3.
Fig. 3. Focusing schlieren images of a helium jet acquired (with the PP installed) at several positions relative to the focal plane both (a) without and (b) with windows placed in the field of view. The camera exposure is 100 µs, and the nozzle outer diameter is ${D_{\rm{N}}} = 1.7 \;{\rm{mm}}$.

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