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Laboratory X-ray interferometry imaging with a fan-shaped source grating

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Abstract

The orientation mismatch between the cone beam of an X-ray tube and the grating lines in a flat substrate remains a big challenge for laboratory grating-based X-ray interferometry, since it severely limits the imaging field of view. Here, we fabricated fan-shaped ${{\rm G}_0}$ source gratings by modulating the electric field during the deep reactive ion etching of silicon. The gold electroplated fan-shaped ${{\rm G}_0}$ grating (3.0 µm pitch) in a 20 keV interferometer improves the uniformity of the field of view with an increase of average visibility from 16.2% to 18.5% and a better angular sensitivity (by a factor 5.8) at the edges.

© 2021 Optical Society of America

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Supplementary Material (1)

NameDescription
Supplement 1       Field of view (FOV) improvement as effect of fan-shaped grating close to the X-ray source (G0).

Data Availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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