Abstract
The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of $G = 4 \cdot {10^4}$, a peak phase-shift sensitivity of Δθ = 27 deg/pm is achieved, corresponding to a spectral resolution of Δλres = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.
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