Author Affiliations

Yingchun Qin,^1,† Shulin Ding,^1,6,† Shujian Lei,¹ Jie Liu,¹ Yan Bai,¹ Menghua Zhang,¹ Yuhang Li,^2,3 Jianming Wen,⁴ Xiaoshun Jiang,^1,* and Min Xiao^1,5

¹National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and School of Physics, Nanjing University, Nanjing 210093, China

²Key Laboratory of Photonic Control Technology (Tsinghua University), Ministry of Education, Beijing 100084, China

³State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China

⁴Department of Physics, Kennesaw State University, Marietta, Georgia 30060, USA

⁵Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA

⁶e-mail: dingsl@nju.edu.cn

^†These authors contributed equally to this Letter.

^*Corresponding author: jxs@nju.edu.cn

ORCID

Yuhang Li	https://orcid.org/0000-0002-2186-0646
Min Xiao	https://orcid.org/0000-0002-0718-9518