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Dynamic spectroscopic imaging ellipsometry

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Abstract

A dynamic spectroscopic imaging ellipsometer (DSIE) employing a monolithic polarizing interferometer is described. The proposed DSIE system can provide spatio-spectral ellipsometric phase map data Δ(λ, x) dynamically at a speed of 30 Hz. We demonstrate the ultrafast mapping capability of the spectroscopic ellipsometer by measuring a patterned 8-inch full wafer with a spatial resolution of less than 50 × 50 µm2 in an hour.

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Supplementary Material (1)

NameDescription
Visualization 1       3-dimensional cubic spectroscopic ellipsometric phase mapping data Delta(?,x,y) in 1 hour by using the proposed DSIE system.

Data availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the corresponding author upon reasonable request.

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