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Ultra-thin mid-infrared silicon grating coupler

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Abstract

Mid-infrared (mid-IR) silicon photonics has been attracting great attention due to its tremendous potential applications in nonlinear optics, ranging, sensing, and spectroscopy. To date, mid-IR silicon devices have usually been developed based on silicon wafers with top-layer silicon thicknesses of hundreds of nanometers. Compared with the thick silicon devices, tens-of-nanometers thin silicon devices can provide giant evanescent-field energy proportions and optical mode areas, being significant for many biochemical sensing and nonlinear optics applications. However, ultra-thin mid-IR silicon devices have seldom been studied due to the difficulty of light coupling. Here, we demonstrated an ultra-thin focusing subwavelength-grating coupler for mid-IR ultra-thin suspended subwavelength-grating-cladding waveguide coupling. The results show that the grating has a maximum coupling efficiency of –7.1 dB at a center wavelength of 2200 nm with a 1-dB bandwidth of ∼115 nm and back reflection of –19.9 dB. We also measured the fiber alignment tolerance of 12 µm for 3-dB coupling efficiency reduction and bending optical loss of 0.25 dB/90°. Our results pave the way to developing mid-IR ultra-thin photonic integrated circuits.

© 2022 Optica Publishing Group

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Supplementary Material (1)

NameDescription
Supplement 1       In this supplemental document, we study the mechanical stability, bending optical loss, and evanescent-field ratio of the ultra-thin SWG-cladding waveguide.

Data availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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